Please use this identifier to cite or link to this item: https://dspace.ctu.edu.vn/jspui/handle/123456789/4953
Title: One-Sample based Single-Valued Estimation of the Interface Profile from Intersubband Integrated Absorption Intensity Data
Authors: Dinh, Nhu Thao
Nguyễn, Thành Tiên
Huynh, Ngoc Toan
Doan, Nhat Quang
Issue Date: 2016
Series/Report no.: Journal of the Physical Society of Japan;85 .- p. 074603
Abstract: We prove the integrated absorption intensity due to intersubband optical transition in a quantum well (QW) to be a function of the correlation length of the interface roughness profile and independent of the roughness amplitude. We then develop a novel way to perform single-valued estimation of the interface roughness profile of QW from experiments conducted merely on one sample. The new method that we propose in this paper would be replicable and more economical than the traditional counterparts, which usually require at least two samples.
URI: http://localhost:8080//jspui/handle/123456789/4953
Appears in Collections:Tạp chí quốc tế

Files in This Item:
File Description SizeFormat 
_file_376.96 kBAdobe PDFView/Open
Your IP: 18.224.44.233


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.