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https://dspace.ctu.edu.vn/jspui/handle/123456789/5269
Title: | Distribution of electronic reconstruction at the n-type LaAIO₃/SrTiO₃ interface revealed by hard x-ray photoemission spectroscopy |
Authors: | Chu, Y. Y. Liao, Y. F. Vũ, Thanh Trà Yang, J. C. Liu, W. Z. Chu, Y. H. Lin, J. Y. Huang, J. H. Weinen, J. Agrestini, S. Tsuei, K. D. Huang, D. J. |
Issue Date: | 2011 |
Series/Report no.: | Applied Physics Letters;99 .- p.1-3 |
Abstract: | We investigated the electronic reconstruction at the n-type LaAlO₃/SrTiO₃ interface with hardx-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapseof evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidenceangle, our HAXPES study reveals a 2% electronic reconstruction from Ti⁴⁺ to Ti³⁺ occurring nearthe interface. Such an electronic reconstruction also extends from the interface into SrTiO₃ with adepth of about 48 Å (~12 unit cells) and an estimated total charge transfer of ~0.24 electrons pertwo-dimensional unit cell. |
URI: | http://localhost:8080//jspui/handle/123456789/5269 |
Appears in Collections: | Tạp chí quốc tế |
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